IC outlier identification using multiple test metrics Academic Article uri icon


  • The use of /DDQ as a test method has been threatened by high leakage currents in nanometer designs. This article suggests a method for keeping it useful and also delineates some of the challenges in recognizing and rejecting outlier parts. © 2005 IEEE.

author list (cited authors)

  • Sabade, S. S., & Walker, D. M.

citation count

  • 12

publication date

  • June 2005