IC outlier identification using multiple test metrics Academic Article

abstract

• The use of /DDQ as a test method has been threatened by high leakage currents in nanometer designs. This article suggests a method for keeping it useful and also delineates some of the challenges in recognizing and rejecting outlier parts. 2005 IEEE.

authors

• Walker, Duncan

published proceedings

• IEEE DESIGN & TEST OF COMPUTERS

author list (cited authors)

• Sabade, S. S., & Walker, D. M.

citation count

• 14

complete list of authors

• Sabade, SS||Walker, DM

publication date

• June 2005

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Design and Test of Computers  Journal

keywords

• 40 Engineering
• 4009 Electronics, Sensors And Digital Hardware

Digital Object Identifier (DOI)

• 10.1109/MDT.2005.143

start page

• 586

end page

• 595

volume

• 22

issue

• 6

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fmdt.2005.143