Challenges in Delay Testing of Integrated Circuits Conference Paper uri icon

abstract

  • Delay testing of integrated circuits is increasingly focused on detecting small delay defects, and improving correlation to functional test. In this talk we will describe our recent efforts and results on industrial designs. 2009 IEEE.

name of conference

  • 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

published proceedings

  • 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

author list (cited authors)

  • Walker, D.

citation count

  • 0

complete list of authors

  • Walker, DMH

publication date

  • January 1, 2009 11:11 AM