Challenges in Delay Testing of Integrated Circuits Conference Paper

abstract

• Delay testing of integrated circuits is increasingly focused on detecting small delay defects, and improving correlation to functional test. In this talk we will describe our recent efforts and results on industrial designs. 2009 IEEE.

name of conference

• 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

authors

• Walker, Duncan

published proceedings

• IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE VLSI SYSTEMS, PROCEEDINGS

author list (cited authors)

• Walker, D.

citation count

• 0

complete list of authors

• Walker, DMH

publication date

• October 2009

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems  Journal

keywords

• 40 Engineering
• 4008 Electrical Engineering

Digital Object Identifier (DOI)

• 10.1109/DFT.2009.53

International Standard Book Number (ISBN) 13

• 978-0-7695-3839-6

start page

• 81

end page

• 82

volume

• 1

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fdft.2009.53