Challenges in Delay Testing of Integrated Circuits Conference Paper uri icon

abstract

  • Delay testing of integrated circuits is increasingly focused on detecting small delay defects, and improving correlation to functional test. In this talk we will describe our recent efforts and results on industrial designs. © 2009 IEEE.

author list (cited authors)

  • Walker, D.

citation count

  • 0

publication date

  • October 2009

publisher