Is I-DDQ test of microprocessors feasible? Conference Paper uri icon

abstract

  • Quiescent leakage current (I DDQ) test nas proven very effective for detecting defects that escape other test methods, such as small delay faults or reliability hazards. However, leakage currents in microprocessors, digital signal processors, and graphics processors have risen to the point that these products no longer use I DDQ test. Quality must be achieved through other test methods, often at higher development and application cost. We propose to bring I DDQ test back to high performance chips by using a practical built-in current sensor (BICS). 180 nm test chip results show that a small sensor can achieve a resolution of 54 A, which is adequate to detect most small delay defects and reliability hazards. 2005 IEEE.

name of conference

  • 2005 Sixth International Workshop on Microprocessor Test and Verification

published proceedings

  • 2013 14th International Workshop on Microprocessor Test and Verification
  • MTV 2005: SIXTH INTERNATIONAL WORKSHOP ON MICROPRESSOR TEST AND VERIFICATION: COMMON CHALLENGES AND SOLUTIONS, PROCEEDINGS

author list (cited authors)

  • Xue, B., & Walker, D.

citation count

  • 0

complete list of authors

  • Xue, Bin||Walker, DMH

publication date

  • November 2006