On comparison of NCR effectiveness with a reduced I/sub DDQ/ vector set
- Additional Document Info
- View All
I DDQ test-based outlier rejection becomes difficult for deep sub-micron technology chips due to increased leakage and process variations. The use of Neighbor Current Ratio (NCR) that uses wafer-level spatial correlation for identifying outlier chips has been proposed earlier as a means of coping with these issues. Due to the slow speed of I DDQ test, there is a strong motivation to reduce the number of test vectors without compromising the fault coverage. In this paper, we examine the effectiveness of Neighbor Current Ratio using a reduced I DDQ vector set and industrial test data.
name of conference
22nd IEEE VLSI Test Symposium, 2004.
22nd IEEE VLSI Test Symposium, 2004. Proceedings.
author list (cited authors)
complete list of authors