Comparison of NCR effectiveness with a reduced I-DDQ vector set Conference Paper

abstract

• I DDQ test-based outlier rejection becomes difficult for deep sub-micron technology chips due to increased leakage and process variations. The use of Neighbor Current Ratio (NCR) that uses wafer-level spatial correlation for identifying outlier chips has been proposed earlier as a means of coping with these issues. Due to the slow speed of I DDQ test, there is a strong motivation to reduce the number of test vectors without compromising the fault coverage. In this paper, we examine the effectiveness of Neighbor Current Ratio using a reduced I DDQ vector set and industrial test data.

name of conference

• 22nd IEEE VLSI Test Symposium, 2004. Proceedings.

authors

• Walker, Duncan

published proceedings

• 22ND IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS

author list (cited authors)

• Sabade, S., & Walker, D.

citation count

• 2

complete list of authors

• Sabade, S||Walker, DMH

publication date

• January 2004

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• n1093-0167ISSN  Journal

keywords

• 40 Engineering
• 4009 Electronics, Sensors And Digital Hardware

Digital Object Identifier (DOI)

• 10.1109/VTEST.2004.1299227

International Standard Book Number (ISBN) 10

• 0-7695-2134-7

start page

• 65

end page

• 70

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fvtest.2004.1299227