On comparison of NCR effectiveness with a reduced I/sub DDQ/ vector set Conference Paper uri icon

abstract

  • I DDQ test-based outlier rejection becomes difficult for deep sub-micron technology chips due to increased leakage and process variations. The use of Neighbor Current Ratio (NCR) that uses wafer-level spatial correlation for identifying outlier chips has been proposed earlier as a means of coping with these issues. Due to the slow speed of I DDQ test, there is a strong motivation to reduce the number of test vectors without compromising the fault coverage. In this paper, we examine the effectiveness of Neighbor Current Ratio using a reduced I DDQ vector set and industrial test data.

name of conference

  • 22nd IEEE VLSI Test Symposium, 2004.

published proceedings

  • 22nd IEEE VLSI Test Symposium, 2004. Proceedings.

author list (cited authors)

  • Sabade, S., & Walker, D.

citation count

  • 2

complete list of authors

  • Sabade, S||Walker, DMH

publication date

  • January 2004

publisher