I-DDQ test: Will it survive the DSM challenge? Academic Article

abstract

• Leakage current, or IDDQ (direct drain quiescent current), test is a defect-based test that measures device supply current under steady-state conditions. It can detect shorts (bridges) between two signals or between signal and power supply lines (both categories called active or pattern-dependent defects), or between VDD and ground (called pattern-independent or passive defects). This paper describes the challenges to IDDQ testing posed by DSM technologies and discusses several IDDQ test methods that aim at reducing variance in fault-free leakage current using various correlation and data analysis methods.

authors

• Walker, Duncan

published proceedings

• IEEE DESIGN & TEST OF COMPUTERS

altmetric score

• 3

author list (cited authors)

• Sabade, S. S., & Walker, D.

citation count

• 21

complete list of authors

• Sabade, SS||Walker, DMH

publication date

• September 2002

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Design and Test of Computers  Journal

keywords

• 4 Detection, Screening And Diagnosis
• 4.1 Discovery And Preclinical Testing Of Markers And Technologies
• 40 Engineering
• 4018 Nanotechnology
• Rehabilitation

Digital Object Identifier (DOI)

• 10.1109/MDT.2002.1033787

start page

• 8

end page

• 16

volume

• 19

issue

• 5

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fmdt.2002.1033787