I/sub DDQ/ test: will it survive the DSM challenge? Academic Article uri icon

abstract

  • Leakage current, or IDDQ (direct drain quiescent current), test is a defect-based test that measures device supply current under steady-state conditions. It can detect shorts (bridges) between two signals or between signal and power supply lines (both categories called active or pattern-dependent defects), or between VDD and ground (called pattern-independent or passive defects). This paper describes the challenges to IDDQ testing posed by DSM technologies and discusses several IDDQ test methods that aim at reducing variance in fault-free leakage current using various correlation and data analysis methods.

published proceedings

  • IEEE Design & Test of Computers

altmetric score

  • 3

author list (cited authors)

  • Sabade, S. S., & Walker, D.

citation count

  • 20

complete list of authors

  • Sabade, SS||Walker, DMH

publication date

  • September 2002