I/sub DDQ/ test: will it survive the DSM challenge?
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Leakage current, or IDDQ (direct drain quiescent current), test is a defect-based test that measures device supply current under steady-state conditions. It can detect shorts (bridges) between two signals or between signal and power supply lines (both categories called active or pattern-dependent defects), or between VDD and ground (called pattern-independent or passive defects). This paper describes the challenges to IDDQ testing posed by DSM technologies and discusses several IDDQ test methods that aim at reducing variance in fault-free leakage current using various correlation and data analysis methods.
author list (cited authors)
Sabade, S. S., & Walker, D.