Evaluation of effectiveness of median of absolute deviations outlier rejection-based I-DDQ testing for burn-in reduction Conference Paper

abstract

• 2002 IEEE. CMOS chips having high leakage are observed to have high burn-in fallout rate. IDDQ testing has been considered as an alternative to burn-in. However, increased subthreshold leakage current in deep submicron technologies limits the use of IDDQ testing in its present form. In this work, a statistical outlier rejection technique known as the median of absolute deviations (MAD) is evaluated as a means to screen early failures using IDDQ data. MAD is compared with delta IDDQ and current signature methods. The results of the analysis of the SEMATECH data are presented.

name of conference

• Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)

authors

• Walker, Duncan

published proceedings

• 20TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS

author list (cited authors)

• Sabade, S. S., & Walker, D. M.

citation count

• 26

complete list of authors

• Sabade, SS||Walker, DM

publication date

• January 2002

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• n1093-0167ISSN  Journal

keywords

• 40 Engineering
• 49 Mathematical Sciences
• 4905 Statistics

Digital Object Identifier (DOI)

• 10.1109/VTS.2002.1011115

International Standard Book Number (ISBN) 10

• 0-7695-1570-3

start page

• 81

end page

• 86

volume

• 2002-January

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fvts.2002.1011115