Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing for Burn-in Reduction Conference Paper uri icon

abstract

  • © 2002 IEEE. CMOS chips having high leakage are observed to have high burn-in fallout rate. IDDQ testing has been considered as an alternative to burn-in. However, increased subthreshold leakage current in deep submicron technologies limits the use of IDDQ testing in its present form. In this work, a statistical outlier rejection technique known as the median of absolute deviations (MAD) is evaluated as a means to screen early failures using IDDQ data. MAD is compared with delta IDDQ and current signature methods. The results of the analysis of the SEMATECH data are presented.

author list (cited authors)

  • Sabade, S. S., & Walker, D. M.

citation count

  • 25

publication date

  • January 2002