Comparison of Effectiveness of Current Ratio and Delta-IDDQ Tests
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I DDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. Current two test methods that promise to extend the life of I DDQ test are Current Ratio and Delta-I DDQ. Although several studies have been reported on these methods, their effectiveness in detecting defects has not been contrasted. In this work, we compare these two methods using industrial test data.
author list (cited authors)
Sabade, S. S., & Walker, D.