Comparison of effectiveness of Current Ratio and Delta-I/sub DDQ/ tests Conference Paper uri icon

abstract

  • I DDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. Current two test methods that promise to extend the life of I DDQ test are Current Ratio and Delta-I DDQ. Although several studies have been reported on these methods, their effectiveness in detecting defects has not been contrasted. In this work, we compare these two methods using industrial test data.

name of conference

  • . 17th International Conference on VLSI Design

published proceedings

  • 17th International Conference on VLSI Design. Proceedings.

author list (cited authors)

  • Sabade, S. S., & Walker, D.

citation count

  • 6

complete list of authors

  • Sabade, SS||Walker, DMH

publication date

  • January 2004