Comparison of wafer-level spatial I-DDQ estimation methods: NNR versus NCR Conference Paper

abstract

• Extending the useful life of IDDQtest to deep submicron technologies has been a topic of interest in recent years. IDDQtest loses its effectiveness as the signal to noise ratio degrades due to rising background current and fault-free IDDQvariance. Defect detection using IDDQtest requires separation of deterministic sources of variation from defective current. Several methods that use deterministic variation in IDDQat the wafer level for estimating fault-free IDDQof a chip are proposed. This paper compares two such methods: Nearest Neighbor Residual (NNR) and Neighbor Current Ratio (NCR). These methods are evaluated using industrial test data for a recent technology. 2004 IEEE.

name of conference

• Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004)

authors

• Walker, Duncan

published proceedings

• DBT 2004: PROCEEDINGS OF THE 2004 IEEE INTERNATIONAL WORKSHOP ON CURRENT & DEFECT BASED TESTING

author list (cited authors)

• Sabade, S. S., & Walker, D.

citation count

• 3

complete list of authors

• Sabade, SS||Walker, DMH

publication date

• January 2004

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

keywords

• I-ddq Testing
• Ncr
• Nnr
• Spatial Correlation

Digital Object Identifier (DOI)

• 10.1109/DBT.2004.1408947

International Standard Book Number (ISBN) 10

• 0-7803-8950-6

International Standard Book Number (ISBN) 13

• 9780780389502

start page

• 17

end page

• 22

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fdbt.2004.1408947