Technology Scaling Issues of an IDDQ Built-In Current Sensor Conference Paper

abstract

• Analysis and comparison of 1.5 m and 350 nm CMOS test chip results of a built-in current sensor design reveal several critical design issues. This paper includes a discussion of these issues. The success of the sensor design hinges on how these issues are addressed in order to achieve successful operation during technology scaling.

name of conference

• Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005.

authors

• Walker, Duncan

published proceedings

• Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005.

author list (cited authors)

• Xue, B., & Walker, D.

citation count

• 1

complete list of authors

• Xue, Bin||Walker, DMH

publication date

• January 2005

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

keywords

• Emerging Infectious Diseases

Digital Object Identifier (DOI)

• 10.1109/dbt.2005.1531295

International Standard Book Number (ISBN) 10

• 1424400341

International Standard Book Number (ISBN) 13

• 9781424400348

start page

• 10

end page

• 15

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fdbt.2005.1531295