NCR: A self-scaling, self-calibrated metric for I-DDQ outlier identification Conference Paper

abstract

• IDDQtesting is an important component of a test suite. However, increasing leakage current values with each technology node render single pass/fail limit setting approach obsolete. This is further worsened due to increasing process variations and discriminating faulty and fault-free chips is becoming increasingly difficult. In this paper we evaluate a metric that uses wafer-level spatial information to identify faulty dice on a wafer. The metric is evaluated using industrial test data.

name of conference

• The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002.

authors

• Walker, Duncan

published proceedings

• 2002 45TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL I, CONFERENCE PROCEEDINGS
• The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002.

author list (cited authors)

• Sabade, S. S., & Walker, D.

citation count

• 4

complete list of authors

• Sabade, SS||Walker, DMH

publication date

• January 2002

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

Digital Object Identifier (DOI)

• 10.1109/mwscas.2002.1187239

International Standard Book Number (ISBN) 10

• 0-7803-7523-8

start page

• 392

end page

• 395

volume

• 1

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fmwscas.2002.1187239