NCR: A self-scaling, self-calibrated metric for I-DDQ outlier identification Conference Paper uri icon

abstract

  • IDDQtesting is an important component of a test suite. However, increasing leakage current values with each technology node render single pass/fail limit setting approach obsolete. This is further worsened due to increasing process variations and discriminating faulty and fault-free chips is becoming increasingly difficult. In this paper we evaluate a metric that uses wafer-level spatial information to identify faulty dice on a wafer. The metric is evaluated using industrial test data.

name of conference

  • The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002.

published proceedings

  • 2002 45TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL I, CONFERENCE PROCEEDINGS
  • The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002.

author list (cited authors)

  • Sabade, S. S., & Walker, D.

citation count

  • 4

complete list of authors

  • Sabade, SS||Walker, DMH

publication date

  • January 2002