Improved Power Supply Noise Control for Pseudo Functional Test Conference Paper

abstract

• Differences in power supply noise (PSN) between functional and structural delay testing can lead to differences in chip operating frequencies of 30% or more. High delay correlation between structural and functional test requires the paths under test to experience the worst-case realistic PSN. We present a PSN control method for pseudo functional test that combines random flipping and background patterns to efficiently fill don't care bits. Dynamic bit weighting permits intelligent selection of background patterns. Experimental results on benchmark circuits achieve worst-case realistic PSN in significantly less CPU time than prior techniques. 2014 IEEE.

name of conference

• 2014 IEEE 32nd VLSI Test Symposium (VTS)

authors

• Walker, Duncan

published proceedings

• 2014 IEEE 32ND VLSI TEST SYMPOSIUM (VTS)

author list (cited authors)

• Zhang, T., & Walker, D.

citation count

• 14

complete list of authors

• Zhang, Tengteng||Walker, Duncan M Hank

publication date

• April 2014

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• n1093-0167ISSN  Journal

keywords

• Delay Testing
• Power Supply Noise
• Pseudo-functional Test

Digital Object Identifier (DOI)

• 10.1109/vts.2014.6818784

International Standard Book Number (ISBN) 13

• 9781479926114

start page

• 1

end page

• 6

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fvts.2014.6818784