Requirements for practical I-DDQ testing of deep submicron circuits Conference Paper

abstract

• 2000 IEEE. This paper describes the requirements that quiescent current (IDDQ) testing must meet in order to continue being useful in the face of rising background currents. Using projections from the 1999 International Technology Roadmap for Semiconductors, several different techniques are evaluated to determine their usefulness in future technologies.

name of conference

• Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637)

authors

• Walker, Duncan

published proceedings

• 2000 IEEE INTERNATIONAL WORKSHOP ON DEFECT BASED TESTING, PROCEEDINGS

author list (cited authors)

• Walker, D.

citation count

• 14

complete list of authors

• Walker, DMH

publication date

• January 2000

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

keywords

• 40 Engineering
• 4008 Electrical Engineering
• 46 Information And Computing Sciences

Digital Object Identifier (DOI)

• 10.1109/DBT.2000.843685

International Standard Book Number (ISBN) 10

• 0-7695-0637-2

International Standard Book Number (ISBN) 13

• 9780769506371

start page

• 15

end page

• 20

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fdbt.2000.843685