Time-Division-Multiplexed Test Delivery for NoC Systems Academic Article uri icon


  • Much current research has focused on employing networks on chips (NoCs) for communication among numerous cores on large-scale SoCs. One side benefit of such designs is the potential to use this communication infrastructure with little modification for manufacturing test delivery. This article presents a test-scheduling approach for such designs that minimizes test time through high-speed test delivery over the network and lower-rate test execution at the target cores. To achieve this, the authors interleave test data over the network via time-division multiplexing (TDM). To demonstrate the utility of this approach, they present a test-scheduling algorithm and a simulated test case from ITC 2002 SoC benchmarks. The results show significant test time and I/O savings when compared to a single-clock approach. 2008 IEEE.

published proceedings

  • IEEE Design and Test

author list (cited authors)

  • Nolen, J. M., & Mahapatra, R. N.

citation count

  • 15

complete list of authors

  • Nolen, JM||Mahapatra, RN

publication date

  • January 2008