Time-Division-Multiplexed Test Delivery for NoC Systems Academic Article

abstract

• Much current research has focused on employing networks on chips (NoCs) for communication among numerous cores on large-scale SoCs. One side benefit of such designs is the potential to use this communication infrastructure with little modification for manufacturing test delivery. This article presents a test-scheduling approach for such designs that minimizes test time through high-speed test delivery over the network and lower-rate test execution at the target cores. To achieve this, the authors interleave test data over the network via time-division multiplexing (TDM). To demonstrate the utility of this approach, they present a test-scheduling algorithm and a simulated test case from ITC 2002 SoC benchmarks. The results show significant test time and I/O savings when compared to a single-clock approach. 2008 IEEE.

authors

• Mahapatra, Rabinarayan

published proceedings

• IEEE Design and Test

author list (cited authors)

• Nolen, J. M., & Mahapatra, R. N.

citation count

• 15

complete list of authors

• Nolen, JM||Mahapatra, RN

publication date

• January 2008

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Design and Test  Journal

keywords

• Clinical Research

Digital Object Identifier (DOI)

• 10.1109/mdt.2008.27

start page

• 44

end page

• 51

volume

• 25

issue

• 1

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fmdt.2008.27