Built-in self test of RF transceiver SoCs: from signal chain to RF synthesizers (Invited) Conference Paper

abstract

• Built-in self test techniques for local oscillator phase noise, RF front-end circuits, baseband building blocks and transceiver loop-back are described. CMOS implementation of integrated RF test components, including RF detectors and phase discriminators are introduced. These devices eliminate the need for expensive external test equipment. The presented test strategies can also be used at wafer-level for fault diagnosis, localization and yield estimation. Silicon characterization results verifying most of these techniques are provided. 2007 IEEE.

name of conference

• 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium

authors

• Silva-Martinez, Jose

published proceedings

• 2007 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS

author list (cited authors)

• Valdes-Garcia, A., Khalil, W., Bakkaloglu, B., Silva-Martinez, J., & Sanchez--Sinencio, E.

citation count

• 26

complete list of authors

• Valdes-Garcia, Alberto||Khalil, Waleed||Bakkaloglu, Bertan||Silva-Martinez, Jose||Sanchez--Sinencio, Edgar

publication date

• June 2007

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium  Journal

keywords

• Amplitude Detector
• Built-in Self Test
• Loopback
• Rf Test
• Vco Phase Noise
• Wireless Transceiver

Digital Object Identifier (DOI)

• 10.1109/RFIC.2007.380895

International Standard Book Number (ISBN) 10

• 1424405319

International Standard Book Number (ISBN) 13

• 978-1-4244-0530-5

start page

• 335

end page

• +

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Frfic.2007.380895