Automated Fault Analysis in a Smart Grid Conference Paper

abstract

• The latest technology development makes many intelligent electronic devices (IEDs) available in substations today. This brings an opportunity for adding new functionalities that go well beyond what the traditional substation automation solutions have provided. The substation automation role in automated fault analysis may be expanding towards better serving many utility groups: operations, protection and asset management.

name of conference

• 2009 Transmission & Distribution Conference & Exposition: Asia and Pacific

authors

• Kezunovic, Mladen

published proceedings

• T& D ASIA: 2009 TRANSMISSION & DISTRIBUTION CONFERENCE & EXPOSITION: ASIA AND PACIFIC

author list (cited authors)

• Kezunovic, M.

citation count

• 7

complete list of authors

• Kezunovic, M

publication date

• October 2009

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

keywords

• Expert System
• Genetic Algorithm
• Intelligent Electronic Device
• Neural Network
• Substation Automation

Digital Object Identifier (DOI)

• 10.1109/td-asia.2009.5356957

International Standard Book Number (ISBN) 13

• 978-1-4244-5229-3

start page

• 237

end page

• 239

volume

• 1

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Ftd-asia.2009.5356957