Uncertainty of Measurement Error in Intelligent Electronic Devices Conference Paper

abstract

• 2014 IEEE. This paper focuses on methodology to quantify uncertainty in measurements obtained from Intelligent Electronic Devices (IED). IEDs have emerged in distribution systems as a prevalent source of measurements in monitoring and protection, as well as for different kinds of applications beyond IED's primary purposes. These measurement devices are installed across a system, from substations down to the customer locations, and provide measurements of a wide array of quantities. We report how IED measurements respond to external disturbances, which may lead to possible accuracy impacts in various applications. The example used to illustrate the approach is highly accurate fault location in distribution systems based on voltage sag measurements.

name of conference

• 2014 IEEE PES General Meeting | Conference & Exposition

authors

• Kezunovic, Mladen

published proceedings

• 2014 IEEE PES GENERAL MEETING - CONFERENCE & EXPOSITION

author list (cited authors)

• Chen, P., Dong, Y., Malbasa, V., & Kezunovic, M.

citation count

• 8

complete list of authors

• Chen, Po-Chen||Dong, Yimai||Malbasa, Vuk||Kezunovic, Mladen

publication date

• July 2014

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Power and Energy Society General Meeting  Journal

keywords

• Fault Location
• Intelligent Electronic Device
• Measurement Uncertainty
• Measurement Units
• Smart Grids

Digital Object Identifier (DOI)

• 10.1109/pesgm.2014.6938884

start page

• 1

end page

• 5

volume

• 2014-October

issue

• October

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fpesgm.2014.6938884