Digitally assisted Analog Compressive Sensing Conference Paper

abstract

• Analog Compressive Sensing (CS) provides a novel strategy to sample and process wideband sparse signals at subNyquist rate. This scheme exploits the signal sparsity to reduce the sampling rate requirements. The analog compressive sensing system performance is greatly impacted by the accuracy of analog circuit components, especially with the scaling of CMOS technology. In this paper, the effect of the circuit imperfections in the analog compressive sensing architecture based on Parallel Segmented Compressive Sensing (PSCS) is discussed, such as the finite settling time, the timing uncertainty and so on. An iterative background calibration algorithm based on LMS (Least Mean Square) is proposed, which is shown to be able to effectively calibrate the error due to the circuit nonideal factors . 2009 IEEE.

name of conference

• 2009 IEEE Dallas Circuits and Systems Workshop (DCAS)

authors

• Hoyos, Sebastian

published proceedings

• 2009 IEEE Dallas Circuits and Systems Workshop (DCAS)

author list (cited authors)

• Yu, Z., & Hoyos, S.

citation count

• 6

complete list of authors

• Yu, Zhuizhuan||Hoyos, Sebastian

publication date

• January 2009

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

Digital Object Identifier (DOI)

• 10.1109/dcas.2009.5505732

International Standard Book Number (ISBN) 13

• 9781424454846

start page

• 1

end page

• 4

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fdcas.2009.5505732