An examination of correlation effects among warranty claims Academic Article

abstract

• This paper models and examines the impact of correlation in a failure arrival process which generates a warranty claim with each occuring failure. We show that ever slight positive correlation in the warranty claims arrival process can significantly impact the expected number of claims observed, and the length of the transient period. We are not suggesting that renewal processes are necessarily inappropriate or incorrect as models for the arriving warranty claims process. Rather, we emphasize the importance of considering correlation in the claims arrival process, and suggest that more research is needed to explore mathematical models which explicitly consider correlation in the warranty analysis framework. 2004 IEEE.

authors

• Wortman, Martin

published proceedings

• IEEE TRANSACTIONS ON RELIABILITY

author list (cited authors)

• Elkins, D. A., & Wortman, M. A.

citation count

• 4

complete list of authors

• Elkins, DA||Wortman, MA

publication date

• June 2004

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Transactions on Reliability  Journal

keywords

• Correlation
• Failure Process Models
• Markov Renewal Process
• Renewal Process
• Warranty Claims

Digital Object Identifier (DOI)

• 10.1109/TR.2004.829149

start page

• 200

end page

• 204

volume

• 53

issue

• 2

URL

• http://dx.doi.org/10.1109/tr.2004.829149