Surface absorption measurements of thin films by cavity-enhanced photothermal spectroscopy. Academic Article uri icon


  • Cavity-enhanced photothermal spectroscopy has been applied to perform ultrasensitive absorption measurements on thin metallic and high-reflectivity dielectric films. The novel method can be employed to determine minute surface-specific absorbances of alpha in the range of a few parts in 10(6) and has high sensitivity since the sample is placed inside a resonant optical cavity. Spatial-, spectral-, and time-resolved measurements were carried out. Laser surface heating calculations have been performed and can be evaluated to yield the thermal diffusivity of the thin films with a resolution at the level of a few micrometers.

published proceedings

  • Opt Lett

author list (cited authors)

  • Schuessler, H. A., Chen, S. H., Rong, Z., & Tang, Z. C.

citation count

  • 1

complete list of authors

  • Schuessler, HA||Chen, SH||Rong, Z||Tang, ZC

publication date

  • April 1991