Surface absorption measurements of thin films by cavity-enhanced photothermal spectroscopy. Academic Article

abstract

• Cavity-enhanced photothermal spectroscopy has been applied to perform ultrasensitive absorption measurements on thin metallic and high-reflectivity dielectric films. The novel method can be employed to determine minute surface-specific absorbances of alpha in the range of a few parts in 10(6) and has high sensitivity since the sample is placed inside a resonant optical cavity. Spatial-, spectral-, and time-resolved measurements were carried out. Laser surface heating calculations have been performed and can be evaluated to yield the thermal diffusivity of the thin films with a resolution at the level of a few micrometers.

authors

• Schuessler, Hans

published proceedings

• Opt Lett

author list (cited authors)

• Schuessler, H. A., Chen, S. H., Rong, Z., & Tang, Z. C.

citation count

• 1

complete list of authors

• Schuessler, HA||Chen, SH||Rong, Z||Tang, ZC

publication date

• April 1991

publisher

• Optica Publishing Group  Publisher

published in

• Optics Letters  Journal

keywords

• 0299 Other Physical Sciences
• 0306 Physical Chemistry (incl. Structural)

PubMed Central ID

• 19774014

Digital Object Identifier (DOI)

• 10.1364/ol.16.000608

start page

• 608

end page

• 610

volume

• 16

issue

• 8

URL

• http://dx.doi.org/10.1364/ol.16.000608