The Effects of Ground Permittivity and Surface Roughness on Multi-Path Measurements at K-band
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Using an open-ended waveguide dielectric measurement technique on different ground materials, a multi-layer ground model was developed. The model was used in path loss calculation and showed good agreement with measurement results. These measurements demonstrate that for the rough surfaces, a more advance model is required for accurate propagation modeling.
author list (cited authors)
Brunetts, J. D., Aryanfar, F., Entesari, K., & Yang, T.