The Effects of Ground Permittivity and Surface Roughness on Multi-Path Measurements at K-band Conference Paper

abstract

• Using an open-ended waveguide dielectric measurement technique on different ground materials, a multi-layer ground model was developed. The model was used in path loss calculation and showed good agreement with measurement results. These measurements demonstrate that for the rough surfaces, a more advance model is required for accurate propagation modeling.

name of conference

• IEEE Antennas and Propagation Society International Symposium. Digest. Held in conjunction with: USNC/CNC/URSI North American Radio Sci. Meeting (Cat. No.03CH37450)

authors

• Entesari, Kamran

published proceedings

• IEEE Antennas and Propagation Society International Symposium. Digest. Held in conjunction with: USNC/CNC/URSI North American Radio Sci. Meeting (Cat. No.03CH37450)

author list (cited authors)

• Brunetts, J. D., Aryanfar, F., Entesari, K., & Yang, T.

citation count

• 2

complete list of authors

• Brunetts, Joseph D||Aryanfar, Farshid||Entesari, Kamran||Yang, Taesik

publication date

• January 2003

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• AP-S International Symposium (Digest) (IEEE Antennas and Propagation Society)  Journal

Digital Object Identifier (DOI)

• 10.1109/aps.2003.1219873

start page

• 408

end page

• 411

volume

• 3

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Faps.2003.1219873