The Effects of Ground Permittivity and Surface Roughness on Multi-Path Measurements at K-band Conference Paper uri icon

abstract

  • Using an open-ended waveguide dielectric measurement technique on different ground materials, a multi-layer ground model was developed. The model was used in path loss calculation and showed good agreement with measurement results. These measurements demonstrate that for the rough surfaces, a more advance model is required for accurate propagation modeling.

author list (cited authors)

  • Brunetts, J. D., Aryanfar, F., Entesari, K., & Yang, T.

citation count

  • 2

publication date

  • January 2003

publisher