The effects of ground permittivity and surface roughness on multi-path measurements at K-band
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Using an open-ended waveguide dielectric measurement technique on different ground materials, a multi-layer ground model was developed. The model was used in path loss calculation and showed good agreement with measurement results. These measurements demonstrate that for the rough surfaces, a more advance model is required for accurate propagation modeling.
name of conference
2003 IEEE International Symposium on Antennas and Propagation: URSI North American Radio Science Meeting
IEEE Antennas and Propagation Society International Symposium. Digest. Held in conjunction with: USNC/CNC/URSI North American Radio Sci. Meeting (Cat. No.03CH37450)
author list (cited authors)
Brunett, J. D., Aryanfar, F., Entesari, K., & Yang, T.
complete list of authors
Brunett, JD||Aryanfar, F||Entesari, K||Yang, T