The effects of ground permittivity and surface roughness on multi-path measurements at K-band Conference Paper uri icon

abstract

  • Using an open-ended waveguide dielectric measurement technique on different ground materials, a multi-layer ground model was developed. The model was used in path loss calculation and showed good agreement with measurement results. These measurements demonstrate that for the rough surfaces, a more advance model is required for accurate propagation modeling.

name of conference

  • 2003 IEEE International Symposium on Antennas and Propagation: URSI North American Radio Science Meeting

published proceedings

  • IEEE Antennas and Propagation Society International Symposium. Digest. Held in conjunction with: USNC/CNC/URSI North American Radio Sci. Meeting (Cat. No.03CH37450)

author list (cited authors)

  • Brunett, J. D., Aryanfar, F., Entesari, K., & Yang, T.

citation count

  • 2

complete list of authors

  • Brunett, JD||Aryanfar, F||Entesari, K||Yang, T

publication date

  • January 2003

publisher