Short-range order in ultrathin film titanium dioxide studied by Raman spectroscopy Academic Article

abstract

• It is demonstrated here that nonresonant Raman spectroscopy can be used for unequivocal determination of short-range order in ultrathin films, using different structures of titanium dioxide as the model system. Titania films as thin as 7 nm sputter deposited on 111 Si have been analyzed and their phase content determined. 2000 American Institute of Physics.

authors

• Yakovlev, Vladislav

published proceedings

• APPLIED PHYSICS LETTERS

altmetric score

• 3

author list (cited authors)

• Yakovlev, V. V., Scarel, G., Aita, C. R., & Mochizuki, S.

citation count

• 71

complete list of authors

• Yakovlev, VV||Scarel, G||Aita, CR||Mochizuki, S

publication date

• February 2000

publisher

• AIP Publishing  Publisher

published in

• Applied Physics Letters  Journal

Digital Object Identifier (DOI)

• 10.1063/1.125953

start page

• 1107

end page

• 1109

volume

• 76

issue

• 9

URL

• http%3A%2F%2Fdx.doi.org%2F10.1063%2F1.125953