Short-range order in ultrathin film titanium dioxide studied by Raman spectroscopy
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It is demonstrated here that nonresonant Raman spectroscopy can be used for unequivocal determination of short-range order in ultrathin films, using different structures of titanium dioxide as the model system. Titania films as thin as 7 nm sputter deposited on 〈111〉 Si have been analyzed and their phase content determined. © 2000 American Institute of Physics.
author list (cited authors)
Yakovlev, V. V., Scarel, G., Aita, C. R., & Mochizuki, S.