Short-range order in ultrathin film titanium dioxide studied by Raman spectroscopy Academic Article uri icon

abstract

  • It is demonstrated here that nonresonant Raman spectroscopy can be used for unequivocal determination of short-range order in ultrathin films, using different structures of titanium dioxide as the model system. Titania films as thin as 7 nm sputter deposited on 〈111〉 Si have been analyzed and their phase content determined. © 2000 American Institute of Physics.

altmetric score

  • 3

author list (cited authors)

  • Yakovlev, V. V., Scarel, G., Aita, C. R., & Mochizuki, S.

citation count

  • 67

publication date

  • February 2000