Diagnostics of surface layer disordering using optical third harmonic generation of a circular polarized light Academic Article uri icon

abstract

  • A nonlinear optical technique based on a third-harmonic generation of a circular polarized light is proposed for the diagnostics of order-disorder transformations in semiconductors. Applications of this technique to study both noncentrosymmetric (GaAs) and centrosymmetric (Si) materials are demonstrated. © 2001 American Institute of Physics.

author list (cited authors)

  • Yakovlev, V. V., & Govorkov, S. V.

citation count

  • 10

publication date

  • December 2001