Characterization of sidewall Bragg gratings using optical low-coherence interferometry with a broadband source Conference Paper uri icon

abstract

  • 2015 SPIE. In this work, we present fabrication and measurement of sidewall Bragg gratings in chalcogenide arsenic tri-sulfide (As2S3) on titanium-diffused lithium niobate (Ti:LiNbO3) channel waveguides. The transfer matrix method was used to analyze the temporal and spectral response of the sidewall gratings in the mid-infrared. The waveguide sidewall Bragg gratings were fabricated by electron-beam lithography (EBL), metal liftoff and subsequent reactive-ion etching (RIE). Insertion loss of the mid-infrared Ti:LiNbO3 optical waveguides were measured at 2 dB and the propagation loss was estimated to be 0.45 dB/cm. Configuration of an optical low-coherence interferometer that is capable of characterizing the mid-infrared sidewall grating-based devices was experimentally implemented and preliminary results from fiber Bragg gratings are presented.

name of conference

  • Integrated Optics: Devices, Materials, and Technologies XIX

published proceedings

  • INTEGRATED OPTICS: DEVICES, MATERIALS, AND TECHNOLOGIES XIX

author list (cited authors)

  • Zhang, C., Wang, X., & Madsen, C. K.

complete list of authors

  • Zhang, Chen||Wang, Xin||Madsen, Christi K

editor list (cited editors)

  • Broquin, J., & Nunzi Conti, G.

publication date

  • January 1, 2015 11:11 AM