Molecular Markers Linked to Important Genes in Hard Winter Wheat
- Additional Document Info
- View All
Biotic stresses including diseases (leaf, stem and stripe rusts), arthropods (greenbug [GB], Hessian fly [Hf], Russian wheat aphid [RWA], and wheat curl mite [WCM]) and their transmitted viral diseases significantly affect grain yield and end-use quality of hard winter wheat (Triticum aestivum L.) in the U.S. Great Plains. Many genes or quantitative trait loci (QTL) have been identified for seedling or adult-plant resistance to these stresses. Molecular markers for these genes or QTL have been identified using mapping or cloning. This study summarizes the markers associated with various effective genes, including genes or QTL conferring resistances to arthropods, such as GB (7), RWA (4), Hf (9), and WCM (4) and diseases including leaf, stem and stripe rusts (26) and Wheat streak mosaic virus (WSMV; 2); genes or QTL for end-use quality traits such as high (3) and low (13) molecular weight glutenin subunits, gliadin (3), polyphenol oxidase (2), granule-bound starch synthase (3), puroindoline (2), and preharvesting sprouting (1); genes on wheat-rye (Secale cereale L.) chromosomal translocations of 1AL.1RS and 1BL.1RS; and genes controlling plant height (12), photoperiod sensitivity (1), and vernalization (2). A subset of the markers was validated using a set of diverse wheat lines developed by breeding programs in the Great Plains. These analyses showed that most markers are diagnostic in only limited genetic backgrounds. However, some markers developed from the gene sequences or alien fragments are highly diagnostic across various backgrounds, such as those markers linked to Rht-B1, Rht-D1, Ppd-D1, Glu-D1, Glu-A1, and 1AL.1RS. Knowledge of both genotype and phenotype of advanced breeding lines could help breeders to select the optimal parents to integrate various genes into new cultivars and increase the efficiency of wheat breeding. © Crop Science Society of America.
author list (cited authors)
Liu, S., Rudd, J. C., Bai, G., Haley, S. D., Ibrahim, A., Xue, Q., ... St. Amand, P.