Fast amplitude and delay measurement for characterization of integrated optic devices Conference Paper uri icon

abstract

  • A fast, non-interferometric measurement technique that allows the frequency-dependent delay and amplitude responses to be measured is presented. For a single amplitude and relative phase measurement at a fixed optical wavelength, the measurement time is on the order of a microsecond. RF modulation up to 2.7 GHz can be accommodated. A modified technique using frequency modulation is described to overcome non-idealities in the phase measurement. Results are presented for a fiber Bragg grating and an acetylene gas cell with swept-wavelength laser tuning at a rate of 40 nm/s.

name of conference

  • Integrated Optics: Devices, Materials, and Technologies X

published proceedings

  • INTEGRATED OPTICS: DEVICES, MATERIALS, AND TECHNOLOGIES X

author list (cited authors)

  • Thompson, M., Zhu, H., Rivera, W., Solmaz, M., Adams, D., & Madsen, C. K.

citation count

  • 0

complete list of authors

  • Thompson, M||Zhu, H||Rivera, W||Solmaz, M||Adams, D||Madsen, CK

editor list (cited editors)

  • Sidorin, Y., & Waechter, C. A.

publication date

  • January 1, 2006 11:11 AM