Alleviating NBTI-induced failure in off-chip output drivers
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Negative Bias Temperature Instability (NBTI) causes the threshold voltage of PMOS devices to degrade with time, resulting in a reduced lifetime of a CMOS IC. In this paper, we present an approach to mitigate the degradation due to NBTI for off-chip output drivers. Our approach is based on forcibly inducing relaxation in the individual fingers of the output driver (which is typically implemented in a multi-fingered fashion). The individual fingers are relaxed in a round-robin manner, such that at any given time, k out of n fingers of the driver are being relaxed. Our results show that the proposed approach significantly extends the lifetime of the output driver. Copyright 2012 ACM.
name of conference
the great lakes symposium
Proceedings of the great lakes symposium on VLSI - GLSVLSI '12
author list (cited authors)
Bhadviya, B., Mandal, A., & Khatri, S. P.
complete list of authors
Bhadviya, Bhavitavya||Mandal, Ayan||Khatri, Sunil P