publication venue for
- Statistical Static Timing Analysis Considering the Impact of Power Supply Noise in VLSI Circuits 2006
- A TDM test scheduling method for network-on-chip systems 2006
- Is I-DDQ test of microprocessors feasible? 2006
- A circuit level fault model for resistive shorts of MOS gate oxide 2005
- Testing the path delay faults of ISCAS85 circuit c6288 2003