Improving Boundary Element Methods for Parasitic Extraction** This research was supported by NSF grants CCR-0098329, CCR-0113668, EIA-0223785, and ATP grant 512-0266-2001. Conference Paper uri icon

abstract

  • © 2003 IEEE. We improve the accuracy and speed of boundary element method (BEM) or multipole accelerated BEM for interconnect parasitic extraction. Three techniques are presented and applied to capacitance extraction: selective coefficient enhancement, variable order multipole and multigrid. Experimental results show that the techniques are effective for extracting parasitics between all pairs of conductors, or between selected pairs of conductors.

author list (cited authors)

  • Yan, S., Liu, J., & Shi, W.

citation count

  • 0

publication date

  • January 2003

publisher