The IEEE Reliability Test System-1996. A report prepared by the Reliability Test System Task Force of the Application of Probability Methods Subcommittee Conference Paper uri icon

published proceedings

  • IEEE Transactions on Power Systems

altmetric score

  • 3.25

author list (cited authors)

  • Grigg, C., Wong, P., Albrecht, P., Allan, R., Bhavaraju, M., Billinton, R., ... Singh, C.

citation count

  • 1746

complete list of authors

  • Grigg, C||Wong, P||Albrecht, P||Allan, R||Bhavaraju, M||Billinton, R||Chen, Q||Fong, C||Haddad, S||Kuruganty, S||Li, W||Mukerji, R||Patton, D||Rau, N||Reppen, D||Schneider, A||Shahidehpour, M||Singh, C

publication date

  • January 1999