The IEEE reliability test system - 1996 Conference Paper

authors

• Singh, Chanan

published proceedings

• IEEE TRANSACTIONS ON POWER SYSTEMS

altmetric score

• 3.25

author list (cited authors)

• Grigg, C., Wong, P., Albrecht, P., Allan, R., Bhavaraju, M., Billinton, R., ... Singh, C.

citation count

• 1831

complete list of authors

• Grigg, C||Wong, P||Albrecht, P||Allan, R||Bhavaraju, M||Billinton, R||Chen, Q||Fong, C||Haddad, S||Kuruganty, S||Li, W||Mukerji, R||Patton, D||Rau, N||Reppen, D||Schneider, A||Shahidehpour, M||Singh, C

publication date

• January 1999

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE TRANSACTIONS ON POWER SYSTEMS  Journal

Digital Object Identifier (DOI)

• 10.1109/59.780914

start page

• 1010

end page

• 1018

volume

• 14

issue

• 3