Built-In Self Optimization for Variation Resilience of Analog Filters Conference Paper uri icon

abstract

  • 2015 IEEE. At deep sub-micron integrated circuit technologies and beyond, characteristics of analog circuits are increasingly affected by process variations and device aging. Although design-time approaches are able to take these effects into account, it is very difficult for a single static design to efficiently handle all kinds of variation scenarios. In this work, a built-in self optimization technique is developed such that each analog I chip can autonomously improve its performance in the presence of significant variations. As a demonstration, an on-chip analog self-test platform is implemented to test an active-RC band-pass filter, whose components can be reconfigured to obtain different frequency responses. The desired response is found by a digital circuit implementation of multi-start meta-heuristic optimization. The proposed technique does not rely on external test equipment or any general purpose digital signal processor. Its effectiveness is confirmed by simulations as well as measurement results from a test-chip fabricated in 180 nm CMOS technology.

name of conference

  • 2015 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

published proceedings

  • 2015 IEEE Computer Society Annual Symposium on VLSI

author list (cited authors)

  • Wang, J., Shi, C., Sanchez-Sinencio, E., & Hu, J.

citation count

  • 8

complete list of authors

  • Wang, Jiafan||Shi, Congyin||Sanchez-Sinencio, Edgar||Hu, Jiang

publication date

  • July 2015

publisher