Design and characterization of the SiPM tracking system of NEXT-DEMO, a demonstrator prototype of the NEXT-100 experiment Academic Article uri icon

abstract

  • NEXT-100 experiment aims at searching the neutrinoless double-beta decay of the 136Xe isotope using a TPC filled with a 100 kg of high-pressure gaseous xenon, with 90% isotopic enrichment. The experiment will take place at the Laboratorio Subterr'aneo de Canfranc (LSC), Spain. NEXT-100 uses electroluminescence (EL) technology for energy measurement with a resolution better than 1% FWHM. The gaseous xenon in the TPC additionally allows the tracks of the two beta particles to be recorded, which are expected to have a length of up to 30 cm at 10 bar pressure. The ability to record the topological signature of the 0 events provides a powerful background rejection factor for the experiment. In this paper, we present a novel 3D imaging concept using SiPMs coated with tetraphenyl butadiene (TPB) for the EL read out and its first implementation in NEXT-DEMO, a large-scale prototype of the NEXT-100 experiment. The design and the first characterization measurements of the NEXT-DEMO SiPM tracking system are presented. The SiPM response uniformity over the tracking plane drawn from its gain map is shown to be better than 4%. An automated active control system for the stabilization of the SiPMs gain was developed, based on the voltage supply compensation of the gain drifts. The gain is shown to be stabilized within 0.2% relative variation around its nominal value, provided by Hamamatsu, in a temperature range of 10C. The noise level from the electronics and the SiPM dark noise is shown to lay typically below the level of 10 photoelectrons (pe) in the ADC. Hence, a detection threshold at 10 pe is set for the acquisition of the tracking signals. The ADC full dynamic range (4096 channels) is shown to be adequate for signal levels of up to 200 pe/s, which enables recording most of the tracking signals. 2013 IOP Publishing Ltd and Sissa Medialab srl.

published proceedings

  • JOURNAL OF INSTRUMENTATION

author list (cited authors)

  • Alvarez, V., Ball, M., Borges, F., Carcel, S., Castel, J., Cebrian, S., ... Yahlali, N.

citation count

  • 10

complete list of authors

  • Alvarez, V||Ball, M||Borges, FIG||Carcel, S||Castel, J||Cebrian, S||Cervera, A||Conde, CAN||Dafni, T||Dias, THVT||Diaz, J||Egorov, M||Esteve, R||Evtoukhovitch, P||Fernandes, LMP||Ferrario, P||Ferreira, AL||Freitas, EDC||Garcia, ANC||Gehman, VM||Gil, A||Goldschmidt, A||Gomez, H||Gomez-Cadenas, JJ||Gonzalez-Diaz, D||Gutierrez, RM||Hauptman, J||Hernando Morata, JA||Herrera, DC||Iguaz, FJ||Irastorza, IG||Jinete, MA||Labarga, L||Laing, A||Liubarsky, I||Lopes, JAM||Lorca, D||Losada, M||Luzon, G||Mari, A||Martin-Albo, J||Martinez, A||Miller, T||Moiseenko, A||Monrabal, F||Monteiro, CMB||Mora, FJ||Moutinho, LM||Munoz Vidal, J||Natal da Luz, H||Navarro, G||Nebot-Guinot, M||Nygren, D||Oliveira, CAB||Palma, R||Perez, J||Perez Aparicio, JL||Renner, J||Ripoll, L||Rodriguez, A||Rodriguez, J||Santos, FP||dos Santos, JMF||Segui, L||Serra, L||Shuman, D||Simon, A||Sofka, C||Sorel, M||Toledo, JF||Tomas, A||Torrent, J||Tsamalaidze, Z||Vazquez, D||Veloso, JFCA||Villar, JA||Webb, R||White, JT||Yahlali, N

publication date

  • May 2013