Analysis of the composition of surface layers in hightemperature superconducting materials by the combination of Rutherford backscattering spectrometry and nuclear resonance reaction
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Rutherford backscattering spectrometry combined to the 16O(, ) nuclear resonance (E=3.045 MeV) are used to determine the stoichiometry of Y-Ba-Cu-O superconducting samples. The oxygen depth profile is also measured at thin surface layers of the compound.