Structure and thermal stability of amorphous co-deposited Ti-Al alloys
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The structural nature of co-deposited thin films (1000 A) of TixAl100-x (15x75) alloys has been investigated by X-ray Diffraction (XRD). The films containing 15 to 60 atomic percent titanium are amorphous in nature. The films containing 67 and 75 percent titanium are crystalline in nature, and the grain size depends on the temperature of the substrate during deposition. The thermal stability of the amorphous phases has been estimated by annealing the alloys in UHV followed by analysis by XRD. The crystallization temperatures can be estimated for the amorphous alloys and are: for Ti50Al50 500C < Tcryst 600C, for Ti25Al75 200C < Tcryst 350C, and for Ti15Al85 Tcryst 325C.
Applied physics communications
author list (cited authors)
Mencer, D. E., Naugle, D. G., Cocke, D. L., & Callaway, T. O.
complete list of authors
Mencer, DE||Naugle, DG||Cocke, DL||Callaway, TO