ELECTRON-TRANSPORT PROPERTIES OF PSEUDO-BINARY AMORPHOUS TRANSITION METAL-SIMPLE METAL (AI) ALLOYS Conference Paper uri icon

abstract

  • Values of resistivity, temperature coefficient of resistance and Hall coefficient for a series of amorphous (Ti0.76Ni0.24)1-xAlx cocondensed thin films over a large range of values for x and for a series of amorphous (Ti0.5Cu0.5)1-xAlx melt-spun ribbons for values of x below 0.15 are reported. Values of RH are discussed in terms of the side-jump mechanism. 1991.

published proceedings

  • MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING

author list (cited authors)

  • STEPHENS, T. A., RATHNAYAKA, D., & NAUGLE, D. G.

citation count

  • 12

complete list of authors

  • STEPHENS, TA||RATHNAYAKA, D||NAUGLE, DG

publication date

  • March 1991