Hall coefficient and resistivity of amorphous Ti1-xAlx films. Academic Article uri icon

abstract

  • The resistivity of codeposited amorphous Ti1-xAlx films has been measured from 1.5 to 300 K over the composition range 0.4x0.92, and the Hall coefficient has been measured at 4 K. The resistivity exhibits a relatively small temperature dependence. The magnitude of the room-temperature resistivity varies appreciably with composition, with a broad maximum around 250 cm near x0.5. The Hall coefficient is positive at x=0.4 and increases to a maximum at x0.6. It becomes negative at x0.85 with a value comparable to that of liquid Al at the highest value of x. The positive values of the Hall coefficient and their dramatic increase with x below x0.5 are discussed in terms of current theories for a positive Hall coefficient. 1993 The American Physical Society.

published proceedings

  • Phys Rev B Condens Matter

author list (cited authors)

  • Rathnayaka, K. D., Hennings, B. D., & Naugle, D. G.

citation count

  • 3

complete list of authors

  • Rathnayaka, KD||Hennings, BD||Naugle, DG

publication date

  • September 1993