Automated Wideband Test System, Measurement Uncertainty, and Design of On-chip Six-Port Reflectometers for 5G Applications
Conference Paper
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- Research
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Overview
published proceedings
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2015 85TH ARFTG MICROWAVE MEASUREMENT CONFERENCE
author list (cited authors)
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Hur, B., & Eisenstadt, W. R.
complete list of authors
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Hur, Byul||Eisenstadt, William R
publication date
Research
keywords
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Automatic Testing
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Built-in Self-test
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Embedded Ic Testing
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Reflectometry
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Six-port Reflectometer
Other
URL
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http%3A%2F%2Fdx.doi.org%2F10.1109%2Farftg.2015.7162901
