Automated Wideband Test System, Measurement Uncertainty, and Design of On-chip Six-Port Reflectometers for 5G Applications Conference Paper uri icon

published proceedings

  • 2015 85TH ARFTG MICROWAVE MEASUREMENT CONFERENCE

author list (cited authors)

  • Hur, B., & Eisenstadt, W. R

complete list of authors

  • Hur, Byul||Eisenstadt, William R

publication date

  • January 1, 2015 11:11 AM