Semiconductor test strategies Academic Article uri icon

abstract

  • New manufacturing and process technologies allow designers to place an ever-increasing number of devices on a single integrated circuit, and so modern chips continue to grow in complexity. The result is new devices with more pins, more complex functionality, faster clock speeds, and rising power requirements that are selling for lower and lower average prices. As such, the test industry is searching for innovative solutions to address the rising cost of testing and the growing influence that testing has on the time-to-market for new devices.

author list (cited authors)

  • Ochoa, J. A., & Porter, J. R

complete list of authors

  • Ochoa, JA||Porter, JR

publication date

  • January 1, 2003 11:11 AM