Semiconductor test strategies Academic Article uri icon


  • New manufacturing and process technologies allow designers to place an ever-increasing number of devices on a single integrated circuit, and so modern chips continue to grow in complexity. The result is new devices with more pins, more complex functionality, faster clock speeds, and rising power requirements that are selling for lower and lower average prices. As such, the test industry is searching for innovative solutions to address the rising cost of testing and the growing influence that testing has on the time-to-market for new devices.

published proceedings


author list (cited authors)

  • Ochoa, J. A., & Porter, J. R.

citation count

  • 4

complete list of authors

  • Ochoa, JA||Porter, JR

publication date

  • January 2003