Using active thermography to inspect pin-hole defects in anti-reflective coating with k-mean clustering Academic Article

authors

• Hsieh, Sheng-Jen

published proceedings

• NDT & E INTERNATIONAL

author list (cited authors)

• Wang, H., Hsieh, S., Zhou, X., Peng, B. o., & Singh, B.

citation count

• 12

complete list of authors

• Wang, Hongjin||Hsieh, Sheng-Jen||Zhou, Xunfei||Peng, Bo||Singh, Bhavana

publication date

• December 2015

publisher

• Elsevier  Publisher

published in

• Independent Nondestructive Testing and Evaluation (NDT and E) International  Journal

keywords

• Anti-reflection Films For Display Screen
• K-means Clustering
• Ndt
• Thermography

Digital Object Identifier (DOI)

• 10.1016/j.ndteint.2015.08.006

start page

• 66

end page

• 72

volume

• 76

URL

• http://dx.doi.org/10.1016/j.ndteint.2015.08.006