Half-life of the electron-capture decay ofRu97: Precision measurement shows no temperature dependence Academic Article uri icon

abstract

  • We have measured the half-life of the electron-capture (ec) decay of Ru97 in a metallic environment, both at low temperature (19 K), and also at room temperature. We find the half-lives at both temperatures to be the same within 0.1%. This demonstrates that a recent claim that the ec decay half-life for Be7 changes by 0.9%0.2% under similar circumstances certainly cannot be generalized to other ec decays. Our results for the half-life of Ru97, 2.8370(14) d at room temperature and 2.8382(14)d at 19K, are consistent with, but much more precise than, previous room-temperature measurements. In addition, we have also measured the half-lives of the - emitters Ru103 and Rh105 at both temperatures, and found them also to be unchanged. 2009 The American Physical Society.

published proceedings

  • Physical Review C

altmetric score

  • 3.75

author list (cited authors)

  • Goodwin, J. R., Golovko, V. V., Iacob, V. E., & Hardy, J. C.

citation count

  • 23

complete list of authors

  • Goodwin, JR||Golovko, VV||Iacob, VE||Hardy, JC

publication date

  • October 2009