Half-life of the electron-capture decay of: Precision measurement shows no temperature dependence
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We have measured the half-life of the electron-capture (ec) decay of Ru97 in a metallic environment, both at low temperature (19 K), and also at room temperature. We find the half-lives at both temperatures to be the same within 0.1%. This demonstrates that a recent claim that the ec decay half-life for Be7 changes by 0.9%0.2% under similar circumstances certainly cannot be generalized to other ec decays. Our results for the half-life of Ru97, 2.8370(14) d at room temperature and 2.8382(14)d at 19K, are consistent with, but much more precise than, previous room-temperature measurements. In addition, we have also measured the half-lives of the - emitters Ru103 and Rh105 at both temperatures, and found them also to be unchanged. 2009 The American Physical Society.
author list (cited authors)
Goodwin, J. R., Golovko, V. V., Iacob, V. E., & Hardy, J. C.
complete list of authors
Goodwin, JR||Golovko, VV||Iacob, VE||Hardy, JC