Precise half-life measurement of the superallowed β+ emitter Si26 Academic Article uri icon

abstract

  • We measured the half-life of the superallowed 0+→0 + β+ emitter Si26 to be 2245.3(7) ms. We used pure sources of Si26 and employed a high-efficiency gas counter, which was sensitive to positrons from both this nuclide and its daughter Al26m. The data were analyzed as a linked parent-daughter decay. To contribute meaningfully to any test of the unitarity of the Cabibbo-Kobayashi-Maskawa (CKM) matrix, the ft value of a superallowed transition must be determined to a precision of 0.1% or better. With a precision of 0.03%, the present result is more than sufficient to be compatible with that requirement. Only the branching ratio now remains to be measured precisely before a ±0.1% ft value can be obtained for the superallowed transition from Si26. © 2010 The American Physical Society.

author list (cited authors)

  • Iacob, V. E., Hardy, J. C., Banu, A., Chen, L., Golovko, V. V., Goodwin, J., ... Tribble, R. E.

citation count

  • 22

publication date

  • September 2010