MEASUREMENT OF THE DIELECTRIC PROPERTIES OF HIGH-PURITY SAPPHIRE AT 1.865 GHZ FROM 2-10 KELVIN Conference Paper

abstract

• A dielectric test cavity was designed and tested to measure the microwave dielectric properties of ultrapure sapphire at cryogenic temperatures. Measurements were performed by placing a large cylindrical crystal of sapphire in a Nb superconducting cavity operating in the TE 01 mode at 1.865 GHz. The dielectric constant, heat capacity, and loss tangent were all calculated using experimental data and RF modeling software. The motivation for these measurements was to determine if such a sapphire could be used as a dielectric lens to focus the magnetic field onto a sample wafer in a high field wafer test cavity. The measured properties have been used to finalize the design of the wafer test cavity. 2012 American Institute of Physics.

name of conference

• ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the Cryogenic Engineering Conference - CEC, Volume 57

authors

• Mcintyre, Peter

published proceedings

• ADVANCES IN CRYOGENIC ENGINEERING, VOLS 57A AND 57B

author list (cited authors)

• Pogue, N. J., McIntyre, P. M., Sattarov, A., & Reece, C.

citation count

• 3

complete list of authors

• Pogue, NJ||McIntyre, PM||Sattarov, A||Reece, C

publication date

• June 2012

publisher

• AIP Publishing  Publisher

published in

• AIP Conference Proceedings  Journal

keywords

• And Heat Capacity
• Loss Tangent
• SRF Cavity
• Sapphire
• Te Mode

Digital Object Identifier (DOI)

• 10.1063/1.4707011

International Standard Book Number (ISBN) 13

• 9780735410206

start page

• 945

end page

• 952

volume

• 1434

issue

• 1

URL

• http%3A%2F%2Fdx.doi.org%2F10.1063%2F1.4707011