Nanodomain analysis with cluster-SIMS: application to the characterization of macromolecular brush architecture Academic Article

abstract

• We present the application of clusterSIMS for the analysis of the nanoscopic surface of diblock brush terpolymers (DBTs). This novel SIMS technique differs from conventional SIMS. It uses Au4004+ projectiles at 520keV and an eventbyevent bombardment/detection regime for the analysis of colocalized molecular species. The performance of this SIMS method was tested on bottle brush block molecules featuring a vertical aligned backbone structure. We were able to assess the extent of secondary ion emissions from the surface and analyze the degree of ordered alignment for DBTs by the fluorocarbon surface coverage. We demonstrate the feasibility of characterizing the homogeneity of macromolecular films at the nanoscale. Copyright 2015 John Wiley & Sons, Ltd.

authors

• Schweikert, Emile
• Wooley, Karen

published proceedings

• SURFACE AND INTERFACE ANALYSIS

altmetric score

• 3

author list (cited authors)

• Yang, F., Cho, S., Sun, G., Verkhoturov, S. V., Thackeray, J. W., Trefonas, P., Wooley, K. L., & Schweikert, E. A.

citation count

• 2

complete list of authors

• Yang, Fan||Cho, Sangho||Sun, Guorong||Verkhoturov, Stanislav V||Thackeray, James W||Trefonas, Peter||Wooley, Karen L||Schweikert, Emile A

publication date

• November 2015

publisher

• Wiley  Publisher

keywords

• Au-400 Sims
• Cluster Sims
• Detection
• Diblock Brush Terpolymers
• Event-by-event Bombardment
• Nanodomain
• Self-assembly

Digital Object Identifier (DOI)

• 10.1002/sia.5812

start page

• 1051

end page

• 1055

volume

• 47

issue

• 11

URL

• http://dx.doi.org/10.1002/sia.5812