Nanodomain analysis with cluster-SIMS: application to the characterization of macromolecular brush architecture Academic Article

abstract

• Copyright 2015 John Wiley & Sons, Ltd. We present the application of cluster-SIMS for the analysis of the nanoscopic surface of diblock brush terpolymers (DBTs). This novel SIMS technique differs from conventional SIMS. It uses Au4004+ projectiles at 520 keV and an event-by-event bombardment/detection regime for the analysis of co-localized molecular species. The performance of this SIMS method was tested on 'bottle brush' block molecules featuring a vertical aligned backbone structure. We were able to assess the extent of secondary ion emissions from the surface and analyze the degree of ordered alignment for DBTs by the fluorocarbon surface coverage. We demonstrate the feasibility of characterizing the homogeneity of macromolecular films at the nanoscale.

authors

• Schweikert, Emile
• Wooley, Karen

published proceedings

• SURFACE AND INTERFACE ANALYSIS

altmetric score

• 3

author list (cited authors)

• Yang, F., Cho, S., Sun, G., Verkhoturov, S. V., Thackeray, J. W., Trefonas, P., Wooley, K. L., & Schweikert, E. A.

citation count

• 2

complete list of authors

• Yang, Fan||Cho, Sangho||Sun, Guorong||Verkhoturov, Stanislav V||Thackeray, James W||Trefonas, Peter||Wooley, Karen L||Schweikert, Emile A

publication date

• September 2015

publisher

• Wiley  Publisher

published in

• Surface and Interface Analysis  Journal

keywords

• Au-400 Sims
• Cluster Sims
• Detection
• Diblock Brush Terpolymers
• Event-by-event Bombardment
• Nanodomain
• Self-assembly

Digital Object Identifier (DOI)

• 10.1002/sia.5812

start page

• 1051

end page

• 1055

volume

• 47

issue

• 11

URL

• http%3A%2F%2Fdx.doi.org%2F10.1002%2Fsia.5812