EXIT CONDITIONS FOR SECONDARY-ION EMISSION INDUCED BY KEV CLUSTER BOMBARDMENT Conference Paper

abstract

• The emission of secondary ions from CsI and phenylalanine surfaces via keV atomic and cluster projectile impacts was studied with coincidence counting time-of-flight mass spectrometry. The results show that not all desorption events from a given projectile are equivalent. The degree of secondary ion correlation was observed to be an inverse function of the kinetic energy and complexity, or efficiency, of the primary ion. For the cases studied, changes in secondary ion correlation are attributed to a change in the ion formation pathway as well as the surface volume excited by a primary projectile. 1993.

authors

• Schweikert, Emile

published proceedings

• NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

author list (cited authors)

• RAY, K. B., PARK, M. A., & SCHWEIKERT, E. A.

citation count

• 9

complete list of authors

• RAY, KB||PARK, MA||SCHWEIKERT, EA

publication date

• July 1993

publisher

• Elsevier  Publisher

published in

• Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms  Journal

keywords

• 51 Physical Sciences
• 5106 Nuclear And Plasma Physics
• 5110 Synchrotrons And Accelerators

Digital Object Identifier (DOI)

• 10.1016/0168-583X(93)96034-A

start page

• 317

end page

• 322

volume

• 82

issue

• 2

URL

• http%3A%2F%2Fdx.doi.org%2F10.1016%2F0168-583x%2893%2996034-a