TRACE ELEMENTAL ANALYSIS BY HEAVY-ION INDUCED X-RAY-EMISSION Academic Article uri icon

abstract

  • The parameters governing x-ray emission and background production resulting from bombardment with high energy oxygen beams have been Investigated. Experimental K and L x-ray yields from thick targets are given for elements of 13 Z 56, and 168On+ energies of 8,16,33,54, and 113 MeV, respectively. The method features a simultaneous multielement capability for trace elements at levels as low as 10-10g in small samples (10-4g). Comparison with experimental data from proton Induced x-ray emission (1.6 MeV Ep 7.0 MeV), shows that the sensitivity Is Improved with 168On+ bombardment. These capabilities are illustrated with analyses of NBS standard materials (orchard leaves, bovine liver, glass) and of a single human hair. 1976, American Chemical Society. All rights reserved.

published proceedings

  • ANALYTICAL CHEMISTRY

author list (cited authors)

  • ZEISLER, R., CROSS, J. B., & SCHWEIKERT, E. A.

citation count

  • 15

complete list of authors

  • ZEISLER, R||CROSS, JB||SCHWEIKERT, EA

publication date

  • December 1976