Coincidence Counting in Time-of-Flight Mass Spectrometry: A Test for Chemical Microhomogeneity. Academic Article

abstract

• Coincidence counting techniques have been combined with time-of-flight mass spectrometry in the examination of surfaces for chemical microhomogeneity. A mathematical formalism was developed to describe the principles underlying this coincidence counting technique and was used to produce a quantitative method for handling the data obtained. This technique of testing for chemical homogeneity has been demonstrated with a sample that consists of a physical mixture of polystyrene and crystals of NaF which were tenths of micrometers in diameter. Ultimately this approach is expected to be useful for the routine testing of surfaces for chemical homogeneity at the level of tens of nanometers.

authors

• Schweikert, Emile

published proceedings

• Science

author list (cited authors)

• Park, M. A., Gibson, K. A., Quinones, K., & Schweikert, M. A.

citation count

• 53

complete list of authors

• Park, MA||Gibson, KA||Quinones, K||Schweikert, MA

publication date

• May 1990

publisher

• American Association for the Advancement of Science (AAAS)  Publisher

published in

• Science  Journal

keywords

• 0306 Physical Chemistry (incl. Structural)

PubMed Central ID

• 17745403

Digital Object Identifier (DOI)

• 10.1126/science.248.4958.988

start page

• 988

end page

• 990

volume

• 248

issue

• 4958

URL

• http%3A%2F%2Fdx.doi.org%2F10.1126%2Fscience.248.4958.988