HEAVY-ION INDUCED K-X-RAYS, L-X-RAYS AND M-X-RAYS AND THEIR USE IN TRACE-ELEMENT ANALYSIS Academic Article uri icon

abstract

  • Characteristic K, L and M X-ray and background production trends from high energy heavy ion bombardment were investigated on a series of target elements (14Z92) using 0.5 MeV/amu and 1 MeV/amu Nn+, On+, Cun+, Krn+ and Xen+ beams. X-ray production for K and L shell X-rays roughly followed the same trends, i.e. increased yield with projectile size and energy and decreased yield with increasing X-ray energy. Broad simultaneous multielement coverage can be achieved using K, L and M Lines. Experimental detection limits of 0.8 to 10 ppm were obtained for elements between Mn and Se with K X-ray detection, between Sm and Pb using L X-ray detection, and for Th and U via M X-ray detection in biological samples with a 1MeV/amu Kr7+ beam of 70 nA for 1000 s. These detection limits are better for many elements than those obtained with a 1.65 MeV proton beam. 1979 Akadmiai Kiad.

published proceedings

  • JOURNAL OF RADIOANALYTICAL CHEMISTRY

author list (cited authors)

  • STOCK, G. J., CROSS, J. B., & SCHWEIKERT, E. A.

citation count

  • 2

complete list of authors

  • STOCK, GJ||CROSS, JB||SCHWEIKERT, EA

publication date

  • March 1979