The unusual structure of tungsten-doped electrochemically-grown alumina films detected by MeV ion scattering Academic Article uri icon


  • MeV Ion scattering has revealed a surprising periodic incorporation of anionic residue in anodically-grown alumina films which may provide important ramification of the properties of these films.

author list (cited authors)

  • Cocke, D. L., Kormali, S. M., Leit, C., Murphy, O. J., Schweikert, E. A., Filpus-Luyckx, P., Polansky, C. A., & Halverson, D. E.

citation count

  • 3

publication date

  • January 1984