THE UNUSUAL STRUCTURE OF TUNGSTEN-DOPED ELECTROCHEMICALLY-GROWN ALUMINA FILMS DETECTED BY MEV ION-SCATTERING Academic Article uri icon

abstract

  • MeV Ion scattering has revealed a surprising periodic incorporation of anionic residue in anodically-grown alumina films which may provide important ramification of the properties of these films.

published proceedings

  • JOURNAL OF THE CHEMICAL SOCIETY-CHEMICAL COMMUNICATIONS

author list (cited authors)

  • COCKE, D. L., KORMALI, S. M., LEITE, C., MURPHY, O. J., SCHWEIKERT, E. A., FILPUSLUYCKX, P., POLANSKY, C. A., & HALVERSON, D. E.

citation count

  • 3

complete list of authors

  • COCKE, DL||KORMALI, SM||LEITE, CVB||MURPHY, OJ||SCHWEIKERT, EA||FILPUSLUYCKX, P||POLANSKY, CA||HALVERSON, DE

publication date

  • January 1984