The unusual structure of tungsten-doped electrochemically-grown alumina films detected by MeV ion scattering
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abstract
MeV Ion scattering has revealed a surprising periodic incorporation of anionic residue in anodically-grown alumina films which may provide important ramification of the properties of these films.
Journal of the Chemical Society, Chemical Communications
author list (cited authors)
Cocke, D. L., Kormali, S. M., Leit, C., Murphy, O. J., Schweikert, E. A., Filpus-Luyckx, P., Polansky, C. A., & Halverson, D. E.
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complete list of authors
Cocke, David L||Kormali, Suphi M||Leit, Carlos V Barros||Murphy, Oliver J||Schweikert, Emile A||Filpus-Luyckx, Paul||Polansky, Christine A||Halverson, D Eric