The unusual structure of tungsten-doped electrochemically-grown alumina films detected by MeV ion scattering
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MeV Ion scattering has revealed a surprising periodic incorporation of anionic residue in anodically-grown alumina films which may provide important ramification of the properties of these films.
author list (cited authors)
Cocke, D. L., Kormali, S. M., Leit, C., Murphy, O. J., Schweikert, E. A., Filpus-Luyckx, P., Polansky, C. A., & Halverson, D. E.