ADVANCES IN ACCELERATOR BASED ANALYSIS TECHNIQUES Academic Article uri icon

abstract

  • Various ion beam techniques (E1 MeV/amu) are compared from the standpoint of their analytical capabilities: Charged Particle Activation Analysis (CPAA), Particle Induced X-Ray Emission (PIXE), Ion Induced -Ray Emission for bulk analysis, Prompt Reaction Analysis (PRA), Rutherford Backscattering Spectrometry for surface layer characterization and ion absorptiometry for microscopic analysis. With CPAA and PIXE70 elements can be detected with sub-ppm sensitivity. The scope of CPAA is being extended with heavy ion beams for radioactivation of H, He, Li, Be, B, C isotopes. In surface layer characterization recent developments in PRA and RBS also involve heavy ion beams. In RBS they can significantly enhance mass resolution for M>50 in comparison with scattering. For example,63Cu and65Cu can be quantitatively identified in surface films using a 1 MeV/amu40Ar beam. In microscopic analysis, the nuclear microprobe can provide atom-specific signals from quantities 10-12 g on spots of a diameter 2 m. Ion absorptiometry techniques can sense density variations as low as 0.5% in 1 m3 or less of sample volume. 1981 Akadmiai Kiad.

published proceedings

  • JOURNAL OF RADIOANALYTICAL CHEMISTRY

author list (cited authors)

  • SCHWEIKERT, E. A.

citation count

  • 7

complete list of authors

  • SCHWEIKERT, EA

publication date

  • March 1981