Coincidence experiments in desorption mass spectrometry Conference Paper uri icon

abstract

  • The detection of coincidental signals can enhance the amount of information available in desorption time-of-flight mass spectrometry (TOF-MS) by identifying physical, chemical and/or spatial correlations between secondary ions. Detection of coincidental emissions requires that the target surface be bombarded with individual primary ions (keV or MeV), each resolved in time and space. This paper will discuss the application of coincidence counting to TOF-MS to: extract the secondary ion mass spectrum and secondary ion yields from an organic target produced by a single primary ion type when multiple primary ions simultaneously impact the sample; examine the metastable dissociation pathways and decay fractions of organic secondary ions using an ion-neutral correlation method; and study the chemical microhomogeneity (on the sub-m scale) of a surface composed of two chemically distinct species. 2002 Published by Elsevier Science B.V.

published proceedings

  • NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

author list (cited authors)

  • Diehnelt, C. W., English, R. D., Van Stipdonk, M. J., & Schweikert, E. A.

citation count

  • 6

complete list of authors

  • Diehnelt, CW||English, RD||Van Stipdonk, MJ||Schweikert, EA

publication date

  • June 2002