A novel approach for coincidence ion mass spectrometry. Academic Article

abstract

• A novel approach is proposed for extracting a maximum of information from secondary ions ejected when surfaces are bombarded with keV mono or polyatomic ions. It is known that the event-by-event bombardment-detection mode allows identification of spatiotemporal relationships among individual secondary ions which in turn reveal surface composition within nanometric dimensions. We have devised a procedure for identifying spatiotemporal relationships among individual secondary ions without the requirement of pulsed sample interrogation (one single projectile at a time). The consequence of "mass separated time-of-flight mass spectrometry" is a much improved measurement duty cycle.

authors

• Schweikert, Emile

published proceedings

• Anal Bioanal Chem

author list (cited authors)

• Verkhoturov, S. V., & Schweikert, E. A.

citation count

• 3

complete list of authors

• Verkhoturov, Stanislav V||Schweikert, Emile A

publication date

• August 2002

publisher

• Springer Nature  Publisher

published in

• Analytical and Bioanalytical Chemistry  Journal

keywords

• Coincidence
• Mass Spectrometry
• Secondary Ions
• Tof
• Wien Filter

PubMed Central ID

• 12185572

Digital Object Identifier (DOI)

• 10.1007/s00216-002-1382-z

start page

• 609

end page

• 611

volume

• 373

issue

• 7

URL

• http%3A%2F%2Fdx.doi.org%2F10.1007%2Fs00216-002-1382-z